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Sistemi AOI ORBOTECH Ultra Discovery VM
parti elettriche / parti elettriche
Fabbricante: ORBOTECH
Modello:Ultra Discovery VM
Tipo di macchina: Sistemi AOI
Numero di articolo: 168185568
Quantità: 1
Data: 07.12.2025
Anno di fabbricazione: 2011
Luogo: Munich, Germany
Prezzo:
Seller-item-No.:8087802
Manufacturer: Orbotech
Model: Ultra Discovery VM
Year of Manufacture: 2011
Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production.
Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time.
Benefits
- High throughput and superior detection with a minimal number of false calls
- Especially designed for inspection of the finest lines down to 10 µm
- Quick setup even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
- SIP Technology
Push-to-Scan:
- A no setup” process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full Step and Repeat” functions
Visual Intelligence:
Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you U51258834 want.
Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects.
Visual Intelligence:
- Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
Find more here - /
Contact us at -
Model: Ultra Discovery VM
Year of Manufacture: 2011
Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production.
Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time.
Benefits
- High throughput and superior detection with a minimal number of false calls
- Especially designed for inspection of the finest lines down to 10 µm
- Quick setup even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
- SIP Technology
Push-to-Scan:
- A no setup” process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full Step and Repeat” functions
Visual Intelligence:
Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you U51258834 want.
Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects.
Visual Intelligence:
- Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
Find more here - /
Contact us at -
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